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18/30381548 DC
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
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| Označení normy: | 18/30381548 DC |
| Počet stran: | 17 |
| Vydáno: | 2018-08-03 |
| Status: | Draft for Comment |
| Alternativní označení: | BS EN 62373-1 |
DESCRIPTION
18/30381548 DC
This standard 18/30381548 DC BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) is classified in these ICS categories:
- 31.080.30 Transistors