Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>25/30513804 DC Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects
Sponsored link
sklademVydáno: 2025-03-25

25/30513804 DC

Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
24.07 €
Anglicky Hardcopy
In stock
24.07 €
Označení normy:25/30513804 DC
Počet stran:30
Vydáno:2025-03-25
Status:Draft for Comment
Alternativní označení:Draft BS IEC 63581-1 Semiconductor devices
DESCRIPTION

25/30513804 DC


This standard 25/30513804 DC Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

Print