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>26/30493764 DC BS ISO 16887 Microbeam analysis. Analytical electron microscopy. Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system
sklademVydáno: 2026-03-02
26/30493764 DC BS ISO 16887 Microbeam analysis. Analytical electron microscopy. Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system

26/30493764 DC

BS ISO 16887 Microbeam analysis. Analytical electron microscopy. Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system

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Označení normy:26/30493764 DC
Počet stran:32
Vydáno:2026-03-02
Status:Draft for Comment
Alternativní označení:BS ISO 16887 Microbeam analysis
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26/30493764 DC


This standard 26/30493764 DC BS ISO 16887 Microbeam analysis. Analytical electron microscopy. Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system is classified in these ICS categories:
  • 71.040.50 Physicochemical methods of analysis

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