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>26/30544420 DC BS EN IEC 62047-58 Semiconductor devices - Micro-electromechanical systems Part 58: Test methods for performances of MEMS thermopile devices
sklademVydáno: 2026-02-20
26/30544420 DC BS EN IEC 62047-58 Semiconductor devices - Micro-electromechanical systems Part 58: Test methods for performances of MEMS thermopile devices

26/30544420 DC

BS EN IEC 62047-58 Semiconductor devices - Micro-electromechanical systems Part 58: Test methods for performances of MEMS thermopile devices

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Označení normy:26/30544420 DC
Počet stran:19
Vydáno:2026-02-20
Status:Draft for Comment
DESCRIPTION

26/30544420 DC


This standard 26/30544420 DC BS EN IEC 62047-58 Semiconductor devices - Micro-electromechanical systems is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

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