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>26/30551649 DC BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
sklademVydáno: 2026-01-30
26/30551649 DC BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test

26/30551649 DC

BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test

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Označení normy:26/30551649 DC
Počet stran:75
Vydáno:2026-01-30
Status:Draft for Comment
DESCRIPTION

26/30551649 DC


This standard 26/30551649 DC BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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