ASTM E0995-25
Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
| Označení normy: | ASTM E0995-25 |
| Vydáno: | 01.04.2025 |
| Status: | Active |
| Počet stran: | 6 |
| Sekce: | 03.06 |
| Označení: | Auger electron spectroscopy; background subtraction; surface analysis; X-ray photoelectron spectroscopy; |
| ASTM označení: | ASTM E995 |
| Nahrazuje: | E0995-16 |
1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation.
1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS).
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.
1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.