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>BS EN 60444-2:1997 Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
sklademVydáno: 1993-09-15
BS EN 60444-2:1997 Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units

BS EN 60444-2:1997

Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units

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Označení normy:BS EN 60444-2:1997
Počet stran:16
Vydáno:1993-09-15
ISBN:0 580 22497 X
Status:Standard
DESCRIPTION

BS EN 60444-2:1997


This standard BS EN 60444-2:1997 Measurement of quartz crystal unit parameters is classified in these ICS categories:
  • 31.140 Piezoelectric devices

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