>BS EN 60749-1:2003 Semiconductor devices. Mechanical and climatic test methods General
sklademVydáno: 2003-07-07
BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
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Označení normy:
BS EN 60749-1:2003
Počet stran:
12
Vydáno:
2003-07-07
ISBN:
0 580 42198 8
Status:
Standard
DESCRIPTION
BS EN 60749-1:2003
This standard BS EN 60749-1:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
31.080.01 Semiconductor devices in general
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
