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>BS EN 60749-31:2003 Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)

sklademVydáno: 2003-07-04

BS EN 60749-31:2003

Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)

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Označení normy:	BS EN 60749-31:2003
Počet stran:	8
Vydáno:	2003-07-04
ISBN:	0 580 42200 3
Status:	Standard

DESCRIPTION

BS EN 60749-31:2003

This standard BS EN 60749-31:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

33.180.20 Fibre optic interconnecting devices
31.080.01 Semiconductor devices in general

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.

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