>BS EN 60749-8:2003 Semiconductor devices. Mechanical and climatic test methods Sealing
sklademVydáno: 2003-07-03
BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
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Označení normy:
BS EN 60749-8:2003
Počet stran:
20
Vydáno:
2003-07-03
ISBN:
0 580 42201 1
Status:
Standard
DESCRIPTION
BS EN 60749-8:2003
This standard BS EN 60749-8:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
31.080.01 Semiconductor devices in general
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.
