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>BS EN IEC 60749-20-1:2026 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
sklademVydáno: 2026-03-20
BS EN IEC 60749-20-1:2026 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

BS EN IEC 60749-20-1:2026 - TC

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

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Označení normy:BS EN IEC 60749-20-1:2026 - TC
Počet stran:115
Vydáno:2026-03-20
ISBN:978 0 539 41577 3
Status:Tracked Changes
DESCRIPTION

BS EN IEC 60749-20-1:2026 - TC


This standard BS EN IEC 60749-20-1:2026 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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