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>BS EN IEC 60749-21:2026 Semiconductor devices. Mechanical and climatic test methods Solderability
sklademVydáno: 2026-02-04
BS EN IEC 60749-21:2026 Semiconductor devices. Mechanical and climatic test methods Solderability

BS EN IEC 60749-21:2026

Semiconductor devices. Mechanical and climatic test methods Solderability

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Označení normy:BS EN IEC 60749-21:2026
Počet stran:26
Vydáno:2026-02-04
ISBN:978 0 539 32738 0
Status:Standard
DESCRIPTION

BS EN IEC 60749-21:2026


This standard BS EN IEC 60749-21:2026 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 29.140.99 Other standards related to lamps
  • 31.080.01 Semiconductor devices in general

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