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>BS EN IEC 63287-2:2023 Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
sklademVydáno: 2023-05-23
BS EN IEC 63287-2:2023 Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile

BS EN IEC 63287-2:2023

Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile

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Označení normy:BS EN IEC 63287-2:2023
Počet stran:22
Vydáno:2023-05-23
ISBN:978 0 539 15664 5
Status:Standard
DESCRIPTION

BS EN IEC 63287-2:2023


This standard BS EN IEC 63287-2:2023 Semiconductor devices. Guidelines for reliability qualification plans is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
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