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Homepage>BS IEC 62047-40:2021 Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
sklademVydáno: 2021-09-14
BS IEC 62047-40:2021 Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold

BS IEC 62047-40:2021

Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold

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Označení normy:BS IEC 62047-40:2021
Počet stran:14
Vydáno:2021-09-14
ISBN:978 0 539 07033 0
Status:Standard
Počet stran (Anglicky):14
ISBN (Anglicky):978 0 539 07033 0
DESCRIPTION

BS IEC 62047-40:2021


This standard BS IEC 62047-40:2021 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices