Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>BS IEC 62047-45:2025 Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of impact resistance of nanostructures
Sponsored link
sklademVydáno: 2025-04-01
BS IEC 62047-45:2025 Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of impact resistance of nanostructures

BS IEC 62047-45:2025

Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of impact resistance of nanostructures

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
190.59 €
Anglicky Hardcopy
In stock
190.59 €
Označení normy:BS IEC 62047-45:2025
Počet stran:18
Vydáno:2025-04-01
ISBN:978 0 539 21849 7
Status:Standard
DESCRIPTION

BS IEC 62047-45:2025


This standard BS IEC 62047-45:2025 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

Print