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>BS IEC 62047-49:2025 Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers
sklademVydáno: 2025-12-03
BS IEC 62047-49:2025 Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers

BS IEC 62047-49:2025

Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers

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Označení normy:BS IEC 62047-49:2025
Počet stran:14
Vydáno:2025-12-03
ISBN:978 0 539 30372 8
Status:Standard
DESCRIPTION

BS IEC 62047-49:2025


This standard BS IEC 62047-49:2025 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080 Semiconductor devices
  • 31.080.99 Other semiconductor devices

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