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sklademVydáno: 2026-03-10
BS IEC 62047-52:2026
Semiconductor devices - Micro-electromechanical devices Part 52: Biaxial tensile testing method for stretchable MEMS
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| Označení normy: | BS IEC 62047-52:2026 |
| Počet stran: | 18 |
| Vydáno: | 2026-03-10 |
| ISBN: | 978 0 539 33390 9 |
| Status: | Standard |
DESCRIPTION
BS IEC 62047-52:2026
This standard BS IEC 62047-52:2026 Semiconductor devices - Micro-electromechanical devices is classified in these ICS categories:
- 31.080.99 Other semiconductor devices