>BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
sklademVydáno: 2019-05-15
BS IEC 62951-6:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
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Označení normy:
BS IEC 62951-6:2019
Počet stran:
28
Vydáno:
2019-05-15
ISBN:
978 0 580 97293 5
Status:
Standard
DESCRIPTION
BS IEC 62951-6:2019
This standard BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices is classified in these ICS categories:
31.080.99 Other semiconductor devices
IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.
