PRICES include / exclude VAT
sklademVydáno: 2020-02-27
BS ISO 14701:2018 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
Non-printable
366.44 €
Anglicky Hardcopy
In stock
366.44 €
| Označení normy: | BS ISO 14701:2018 - TC |
| Počet stran: | 54 |
| Vydáno: | 2020-02-27 |
| ISBN: | 978 0 539 11820 9 |
| Status: | Tracked Changes |
DESCRIPTION
BS ISO 14701:2018 - TC
This standard BS ISO 14701:2018 - TC Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness is classified in these ICS categories:
- 71.040.40 Chemical analysis