PRICES include / exclude VAT
Sponsored link
sklademVydáno: 2022-03-31
BS ISO 17109:2022
Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin films
Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
264.74 €
Anglicky Hardcopy
In stock
264.74 €
Označení normy: | BS ISO 17109:2022 |
Počet stran: | 32 |
Vydáno: | 2022-03-31 |
ISBN: | 978 0 539 19125 7 |
Status: | Standard |
DESCRIPTION
BS ISO 17109:2022
This standard BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin films is classified in these ICS categories:
- 71.040.40 Chemical analysis