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sklademVydáno: 2025-05-27
BS ISO 25498:2025 - TC
Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
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| Označení normy: | BS ISO 25498:2025 - TC |
| Počet stran: | 132 |
| Vydáno: | 2025-05-27 |
| ISBN: | 978 0 539 37163 5 |
| Status: | Tracked Changes |
DESCRIPTION
BS ISO 25498:2025 - TC
This standard BS ISO 25498:2025 - TC Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope is classified in these ICS categories:
- 71.040.50 Physicochemical methods of analysis