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sklademVydáno: 2003-08-13
IEC 60749-11:2002/COR2:2003
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Corrigendum 2 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 11: Variations rapides de température - Méthode des deux bains
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| Označení normy: | IEC 60749-11:2002/COR2:2003 |
| Vydáno: | 2003-08-13 |
| Edice: | 1 |
| ICS: | 31.080.01 |
| Počet stran (Anglicky/Francouzsky): | 0 |
DESCRIPTION
IEC 60749-11:2002/COR2:2003
Modification of the validity date: now put at 2007.