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Homepage>IEC 60749-11:2002/COR2:2003 - Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
sklademVydáno: 2003-08-13
IEC 60749-11:2002/COR2:2003 - Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

IEC 60749-11:2002/COR2:2003

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Corrigendum 2 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 11: Variations rapides de température - Méthode des deux bains

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Označení normy:IEC 60749-11:2002/COR2:2003
Vydáno:2003-08-13
Edice:1
ICS:31.080.01
Počet stran (Anglicky/Francouzsky):0
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IEC 60749-11:2002/COR2:2003

Modification of the validity date: now put at 2007.