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sklademVydáno: 2003-08-12
IEC 60749-2:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Corrigendum 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 2: Basse pression atmosphérique
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| Označení normy: | IEC 60749-2:2002/COR1:2003 |
| Vydáno: | 2003-08-12 |
| Edice: | 1 |
| ICS: | 31.080.01 |
DESCRIPTION
IEC 60749-2:2002/COR1:2003
Modification of the validity date: now put at 2007.