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>IEC 61000-4-29:2000 - Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
sklademVydáno: 2000-08-30
IEC 61000-4-29:2000 - Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

IEC 61000-4-29:2000

Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

Compatibilité électromagnétique (CEM) - Partie 4-29: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et varations de tension sur les accès d'alimentation en courant continu

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Anglicky/Francouzsky Hardcopy
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135.46 €
Anglicky/Francouzsky PDF
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Označení normy:IEC 61000-4-29:2000
Vydáno:2000-08-30
Edice:1
ICS:33.100.20
Počet stran (Anglicky/Francouzsky):37
ISBN (Anglicky/Francouzsky):2831853591
DESCRIPTION

IEC 61000-4-29:2000

Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.

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