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Homepage>IEC 62047-50:2025 - Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones
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sklademVydáno: 2025-04-29
IEC 62047-50:2025 - Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones

IEC 62047-50:2025

Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones

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Označení normy:IEC 62047-50:2025
Vydáno:2025-04-29
Jazyk:Anglicky
DESCRIPTION

IEC 62047-50:2025

IEC 62047-50:2025 defines the test conditions and test methods for the performance of MEMS capacitive microphones. This document applies to MEMS capacitive microphones.

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