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sklademVydáno: 2010-05-19
IEC 62415:2010
Semiconductor devices - Constant current electromigration test
Dispositifs à semiconducteurs - Essai d'électromigration en courant constant
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| Označení normy: | IEC 62415:2010 |
| Vydáno: | 2010-05-19 |
| Edice: | 1 |
| ICS: | 31.080.01 |
DESCRIPTION
IEC 62415:2010
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.