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sklademVydáno: 2010-04-26
IEC 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors
Dispositifs à semiconducteurs - Essai de porteur chaud sur les transistors MOS
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| Označení normy: | IEC 62416:2010 |
| Vydáno: | 2010-04-26 |
| Edice: | 1 |
| ICS: | 31.080.30 |
DESCRIPTION
IEC 62416:2010
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.