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sklademVydáno: 2020-05-27
IEC 62899-503-1:2020
Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
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| Označení normy: | IEC 62899-503-1:2020 |
| Vydáno: | 2020-05-27 |
| Edice: | 1 |
| ICS: | 29.045 |
DESCRIPTION
IEC 62899-503-1:2020
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).