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sklademVydáno: 2025-11-28
IEC 63616:2025
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
Mesurage de la conductivité des films minces métalliques aux hyperfréquences et aux fréquences à ondes millimétriques - Méthode du résonateur à disque circulaire de type symétrique
Format
Availability
Price and currency
Anglicky/Francouzsky Hardcopy
skladem
94.20 €
Anglicky/Francouzsky PDF
Immediate download
Printable
94.20 €
Anglicky Hardcopy
skladem
94.20 €
Anglicky PDF
Immediate download
Printable
94.20 €
| Označení normy: | IEC 63616:2025 |
| Vydáno: | 2025-11-28 |
| Edice: | 1 |
| ICS: | 17.220.20 |
| Počet stran (Anglicky/Francouzsky): | 26 |
| ISBN (Anglicky/Francouzsky): | 9782832708941 |
| Počet stran (Anglicky): | 13 |
| ISBN (Anglicky): | 9782832708941 |
DESCRIPTION
IEC 63616:2025
IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.