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IEC 61439-6:2012
Low-voltage switchgear and controlgear assemblies - Part 6: Busbar trunking systems (busways)
Low-voltage switchgear and controlgear assemblies - Part 6: Busbar trunking systems (busways)
Vydáno: 2012-05-23
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IEC 61481-2:2014
Live working - Phase comparators - Part 2: Resistive type to be used for voltages from 1kV to 36 kV a.c.
Live working - Phase comparators - Part 2: Resistive type to be used for voltages from 1kV to 36 kV a.c.
Vydáno: 2014-10-24
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IEC 61497:1998
Nuclear power plants - Electrical interlocks for functions important to safety - Recommendations for design and implementation
Nuclear power plants - Electrical interlocks for functions important to safety - Recommendations for design and implementation
Vydáno: 1998-10-30
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IEC 61499-2:2012
Function blocks - Part 2: Software tool requirements
Function blocks - Part 2: Software tool requirements
Vydáno: 2012-11-07
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IEC 61453:2007
Nuclear instrumentation - Scintillation gamma ray detector systems for the assay of radionuclides - Calibration and routine tests
Nuclear instrumentation - Scintillation gamma ray detector systems for the assay of radionuclides - Calibration and routine tests
Vydáno: 2007-08-10
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ISO/IEC 27033-1:2015
Information technology - Security techniques - Network security - Part 1: Overview and concepts
Information technology - Security techniques - Network security - Part 1: Overview and concepts
Vydáno: 2015-08-10
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Anglicky Hardcopy
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IEC 62047-4:2008
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Vydáno: 2008-08-21
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IEC 62047-7:2011
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Vydáno: 2011-06-16
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IEC 62047-10:2011
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Vydáno: 2011-07-26
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Anglicky/Francouzsky Hardcopy
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Anglicky Hardcopy
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374.39 €
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