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IEC 61481-1:2014
Live working - Phase comparators - Part 1: Capacitive type to be used for voltages exceeding 1 kV a.c.
Live working - Phase comparators - Part 1: Capacitive type to be used for voltages exceeding 1 kV a.c.
Vydáno: 2014-10-24
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IEC 61445:2012
Digital Test Interchange Format (DTIF)
Digital Test Interchange Format (DTIF)
Vydáno: 2012-06-21
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IEC 61499-1:2012
Function blocks - Part 1: Architecture
Function blocks - Part 1: Architecture
Vydáno: 2012-11-07
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458.61 €
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IEC 61501:1998
Nuclear reactor instrumentation - Wide range neutron fluence rate meter - Mean square voltage method
Nuclear reactor instrumentation - Wide range neutron fluence rate meter - Mean square voltage method
Vydáno: 1998-11-10
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91.72 €
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91.72 €
IEC 62040-4:2013
Uninterruptible power systems (UPS) - Part 4: Environmental aspects - Requirements and reporting
Uninterruptible power systems (UPS) - Part 4: Environmental aspects - Requirements and reporting
Vydáno: 2013-04-29
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IEC 62037-4:2012
Passive RF and microwave devices, intermodulation level measurement - Part 4: Measurement of passive intermodulation in coaxial cables
Passive RF and microwave devices, intermodulation level measurement - Part 4: Measurement of passive intermodulation in coaxial cables
Vydáno: 2012-07-24
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IEC 62047-21:2014
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Vydáno: 2014-06-19
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IEC 62047-6:2009
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
Vydáno: 2009-04-07
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IEC TS 62045-1:2006
Multimedia security - Guideline for privacy protection of equipment and systems in and out of use - Part 1: General
Multimedia security - Guideline for privacy protection of equipment and systems in and out of use - Part 1: General
Vydáno: 2006-12-13
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IEC 62047-18:2013
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Vydáno: 2013-07-17
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IEC 62056-1-0:2014
Electricity metering data exchange - The DLMS/COSEM suite - Part 1-0: Smart metering standardisation framework
Electricity metering data exchange - The DLMS/COSEM suite - Part 1-0: Smart metering standardisation framework
Vydáno: 2014-06-04
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