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IEC 60851-2:2009+AMD1:2015 CSV
Winding wires - Test methods - Part 2: Determination of dimensions
Winding wires - Test methods - Part 2: Determination of dimensions
Vydáno: 2015-05-21
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IEC 61034-1:2005+AMD1:2013 CSV
Measurement of smoke density of cables burning under defined conditions - Part 1: Test apparatus
Measurement of smoke density of cables burning under defined conditions - Part 1: Test apparatus
Vydáno: 2013-06-21
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IEC 62047-34:2019
Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Vydáno: 2019-04-05
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IEC 62677-2:2017
Heat shrinkable low and medium voltage moulded shapes - Part 2: Methods of test
Heat shrinkable low and medium voltage moulded shapes - Part 2: Methods of test
Vydáno: 2017-10-11
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IEC 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
Vydáno: 2017-07-26
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IEC 61000-4-12:2017
Electromagnetic Compatibility (EMC) - Part 4-12: Testing and measurement techniques - Ring wave immunity test
Electromagnetic Compatibility (EMC) - Part 4-12: Testing and measurement techniques - Ring wave immunity test
Vydáno: 2017-07-18
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IEC 60444-8:2016
Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
Vydáno: 2016-12-15
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IEC 62801:2020
Measurement method of a half-wavelength voltage for Mach-Zehnder optical modulator in wireless communication and broadcasting systems
Measurement method of a half-wavelength voltage for Mach-Zehnder optical modulator in wireless communication and broadcasting systems
Vydáno: 2020-09-24
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IEC 60300-3-3:2017
Dependability management - Part 3-3: Application guide - Life cycle costing
Dependability management - Part 3-3: Application guide - Life cycle costing
Vydáno: 2017-01-27
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IEC 62435-5:2017
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Vydáno: 2017-01-20
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IEC 60154-4:2017
Flanges for waveguides - Part 4: Relevant specifications for flanges for circular waveguides
Flanges for waveguides - Part 4: Relevant specifications for flanges for circular waveguides
Vydáno: 2017-03-22
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