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IEC 60747-14-3:2009
Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
Vydáno: 2009-04-29
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131.88 €
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131.88 €
IEC 60747-16-3:2002
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
Vydáno: 2002-05-07
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269.49 €
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269.49 €
IEC 60748-3:1986/AMD1:1991
Amendment 1 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
Amendment 1 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
Vydáno: 1991-11-15
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269.49 €
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269.49 €
IEC 60748-3:1986/AMD2:1994
Amendment 2 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
Amendment 2 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
Vydáno: 1994-02-08
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91.74 €
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91.74 €
IEC 60748-2:1997
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
Vydáno: 1997-12-22
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487.37 €
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487.37 €
Hardcopy
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91.74 €
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91.74 €
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131.88 €
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131.88 €
Hardcopy
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172.01 €
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172.01 €
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91.74 €
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91.74 €
IEC 60749-19:2003/AMD1:2010
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Vydáno: 2010-07-28
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11.47 €
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11.47 €
IEC 60749-19:2003+AMD1:2010 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Vydáno: 2010-11-29
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45.87 €
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45.87 €
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172.01 €
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172.01 €