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sklademVydáno: 2017-10-11
IEC TR 63133:2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
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| Označení normy: | IEC TR 63133:2017 |
| Vydáno: | 2017-10-11 |
| Edice: | 1 |
| ICS: | 31.080.01 |
| Počet stran (Anglicky): | 17 |
| ISBN (Anglicky): | 9782832249031 |
DESCRIPTION
IEC TR 63133:2017
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.