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sklademVydáno: 2022-02-08
IEC TS 62607-6-11:2022
Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
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| Označení normy: | IEC TS 62607-6-11:2022 |
| Vydáno: | 2022-02-08 |
| Edice: | 1 |
| ICS: | 07.120 |
| Počet stran (Anglicky): | 27 |
| ISBN (Anglicky): | 9782832243763 |
DESCRIPTION
IEC TS 62607-6-11:2022
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy