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sklademVydáno: 2024
ISO 24173:2024
ISO 24173:2024-Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
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| Označení normy: | ISO 24173:2024 |
| Počet stran: | 40 |
| Vydání: | 2 |
| Vydáno: | 2024 |
| Jazyk: | Anglicky |
| Počet stran (Anglicky): | 40 |
DESCRIPTION
ISO 24173:2024
This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.