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Homepage>ISO 3497:2000-Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
sklademVydáno: 2000
ISO 3497:2000-Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods

ISO 3497:2000

ISO 3497:2000-Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods

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Označení normy:ISO 3497:2000
Počet stran:18
Vydání:3
Vydáno:2000
DESCRIPTION

ISO 3497:2000


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