PD IEC TS 62607-5-3:2020

This standard PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics is classified in these ICS categories:

• 07.120 Nanotechnologies
• 07.030 Physics. Chemistry

This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.