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sklademVydáno: 2004-05-28
UNE EN 60749-1:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 1: Generalidades.
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| Označení normy: | UNE EN 60749-1:2004 |
| Počet stran: | 24 |
| Vydáno: | 2004-05-28 |
| Status: | Norma |
| Počet stran (Španělsky): | 12 |
DESCRIPTION
This standard UNE EN 60749-1:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 1: General is classified in these ICS categories:
- 31.080.01
Categories: