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Homepage>UNE EN 60749-14:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
sklademVydáno: 2004-06-11
UNE EN 60749-14:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)

UNE EN 60749-14:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 14: Robustez de los terminales (integridad de los conectores).

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Označení normy:UNE EN 60749-14:2004
Počet stran:35
Vydáno:2004-06-11
Status:Norma
DESCRIPTION

This standard UNE EN 60749-14:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity) is classified in these ICS categories:

  • 31.080.01
Categories:
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