PRICES include / exclude VAT
sklademVydáno: 2003-05-30
UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 2: Baja presión atmosférica.
Format
Availability
Price and currency
Anglicky PDF
Immediate download
57.60 €
Anglicky Hardcopy
In stock
57.60 €
Španělsky PDF
Immediate download
48.00 €
Španělsky Hardcopy
In stock
48.00 €
| Označení normy: | UNE EN 60749-2:2003 |
| Počet stran: | 19 |
| Vydáno: | 2003-05-30 |
| Status: | Norma |
DESCRIPTION
This standard UNE EN 60749-2:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure. is classified in these ICS categories:
- 31.080.01
Categories: