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sklademVydáno: 2005-03-16
UNE EN 60749-33:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Dispositivos semiconductores. Ensayos mecánicos y climáticos. Parte 33: Resistencia a la humedad acelerada. Autoclave no polarizada
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Anglicky PDF
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57.83 €
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Španělsky PDF
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| Označení normy: | UNE EN 60749-33:2005 |
| Počet stran: | 17 |
| Vydáno: | 2005-03-16 |
| Status: | Norma |
| Počet stran (Španělsky): | 10 |
DESCRIPTION
This standard UNE EN 60749-33:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave is classified in these ICS categories:
- 31.080.01
Categories: