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Homepage>UNE EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
sklademVydáno: 2011-07-20
UNE EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling

UNE EN 60749-34:2011

Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 34: Ciclo de potencia.

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Anglicky PDF
Immediate download
84.96 €
Anglicky Hardcopy
In stock
84.96 €
Španělsky PDF
Immediate download
70.80 €
Španělsky Hardcopy
In stock
70.80 €
Označení normy:UNE EN 60749-34:2011
Počet stran:6
Vydáno:2011-07-20
Status:Norma
Počet stran (Anglicky):6
Počet stran (Španělsky):16
DESCRIPTION

This standard UNE EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling is classified in these ICS categories:

  • 31.080.01
Categories: