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>UNE EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)

sklademVydáno: 2010-09-01

UNE EN 62416:2010

Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)

Dispositivos de semiconductores. Ensayo de portadora caliente en transistores MOS (Ratificada por AENOR en septiembre de 2010.)

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Označení normy:	UNE EN 62416:2010
Počet stran:	13
Vydáno:	2010-09-01
Status:	Norma

DESCRIPTION

This standard UNE EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.) is classified in these ICS categories:

31.080.01

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