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>UNE EN IEC 60749-13:2018 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)

sklademVydáno: 2018-05-01

UNE EN IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 13: Atmósfera salina. (Ratificada por la Asociación Española de Normalización en mayo de 2018.)

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Označení normy:	UNE EN IEC 60749-13:2018
Počet stran:	23
Vydáno:	2018-05-01
Status:	Norma

DESCRIPTION

UNE EN IEC 60749-13:2018

This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive

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