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>UNE EN IEC 61189-2-809:2025 - Test methods for electrical materials, circuit boards and other interconnection structures and assemblies - Part 2-809: X/Y coefficient of thermal expansion (CTE) test for thick base materials by TMA (Endorsed by Asociación Española de Normalización in March of 2025.)
sklademVydáno: 2025-03-01
UNE EN IEC 61189-2-809:2025 - Test methods for electrical materials, circuit boards and other interconnection structures and assemblies - Part 2-809: X/Y coefficient of thermal expansion (CTE) test for thick base materials by TMA (Endorsed by Asociación Española de Normalización in March of 2025.)

UNE EN IEC 61189-2-809:2025

Test methods for electrical materials, circuit boards and other interconnection structures and assemblies - Part 2-809: X/Y coefficient of thermal expansion (CTE) test for thick base materials by TMA (Endorsed by Asociación Española de Normalización in March of 2025.)

Métodos de ensayo para materiales eléctricos, tarjetas impresas y otras estructuras y montajes de interconexión. Parte 2-809: Ensayo de coeficiente de expansión térmica (CTE) X/Y para materiales base gruesos mediante un analizador termomecánico (TMA) (Ratificada por la Asociación Española de Normalización en marzo de 2025.)

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Označení normy:UNE EN IEC 61189-2-809:2025
Počet stran:18
Vydáno:2025-03-01
Status:Norma
DESCRIPTION

UNE EN IEC 61189-2-809:2025

This International Standard defines the method to be followed for the determination of the X/Y coefficient of thermal expansion of electrical insulating materials by the use of a thermomechanical analyser (TMA). This method is applicable to materials that are solid of the entire range of temperature used,and retain sufficient hardness and rigidity over the temperature range so that irreversible indentation of the specimen by the sensing probe does not occur.

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