This document is to develop a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurence in the vehicle communications interface. It offers many new possibilities for the analysis of data interface errors. A representation of the physical layer is particularly during the execution of conformity tests, often indispensable. With data interface-specific trigger conditions and time synchronization, it can find the causes of protocol errors much quicker than with a traditional test method. Figure 1 - The semiconductor-based sensor data interface test with fault injection