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UNE EN 60730-2-5:2015/A1:2019
Automatic electrical controls - Part 2-5: Particular requirements for automatic electrical burner control systems
Automatic electrical controls - Part 2-5: Particular requirements for automatic electrical burner control systems
Vydáno: 2019-06-26
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UNE EN 60745-2-19:2010/A1:2011
Hand-held motor-operated electric tools - Safety -- Part 2-19: Particular requirements for jointers
Hand-held motor-operated electric tools - Safety -- Part 2-19: Particular requirements for jointers
Vydáno: 2011-03-09
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UNE EN 60746-2:2003
Expression of performance of electrochemical analyzers -- Part 2: pH value
Expression of performance of electrochemical analyzers -- Part 2: pH value
Vydáno: 2003-12-23
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UNE EN 60746-3:2004
Expression of performance of electrochemical analyzers -- Part 3: Electrolytic conductivity
Expression of performance of electrochemical analyzers -- Part 3: Electrolytic conductivity
Vydáno: 2004-01-23
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UNE EN 60749-14:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Vydáno: 2004-06-11
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UNE EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Vydáno: 2003-11-21
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UNE EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Vydáno: 2011-12-21
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UNE EN 60749-25:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Vydáno: 2004-06-11
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UNE EN 60749-33:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Vydáno: 2005-03-16
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