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97.10 €
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UNE EN 62415:2010
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Vydáno: 2010-09-01
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UNE EN 62419:2009
Control technology - Rules for the designation of measuring instruments (Endorsed by AENOR in May of 2009.)
Control technology - Rules for the designation of measuring instruments (Endorsed by AENOR in May of 2009.)
Vydáno: 2009-05-01
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UNE EN 62490-1:2010
ESL measuring method -- Part 1: Capacitors with lead terminal for use in electronic equipment (Endorsed by AENOR in November of 2010.)
ESL measuring method -- Part 1: Capacitors with lead terminal for use in electronic equipment (Endorsed by AENOR in November of 2010.)
Vydáno: 2010-11-01
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UNE EN IEC 62037-3:2022
Passive RF and microwave devices, intermodulation level measurement - Part 3: Measurement of passive intermodulation in coaxial connectors
Passive RF and microwave devices, intermodulation level measurement - Part 3: Measurement of passive intermodulation in coaxial connectors
Vydáno: 2022-05-25
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Španělsky PDF
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