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UNE EN 60749-21:2011
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Vydáno: 2011-11-01
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70.68 €
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UNE EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Vydáno: 2011-11-01
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68.29 €
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UNE EN 60793-1-30:2011
Optical fibres -- Part 1-30: Measurement methods and test procedures - Fibre proof test (Endorsed by AENOR in June of 2011.)
Optical fibres -- Part 1-30: Measurement methods and test procedures - Fibre proof test (Endorsed by AENOR in June of 2011.)
Vydáno: 2011-06-01
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UNE EN 60793-1-42:2013
Optical fibres - Part 1-42: Measurement methods and test procedures - Chromatic dispersion (Endorsed by AENOR in May of 2013.)
Optical fibres - Part 1-42: Measurement methods and test procedures - Chromatic dispersion (Endorsed by AENOR in May of 2013.)
Vydáno: 2013-05-01
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UNE EN 60793-1-44:2011
Optical fibres - Part 1-44: Measurement methods and test procedures - Cut-off wavelength (Endorsed by AENOR in October of 2011.)
Optical fibres - Part 1-44: Measurement methods and test procedures - Cut-off wavelength (Endorsed by AENOR in October of 2011.)
Vydáno: 2011-10-01
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